| Characterization of Irradiated Doping Profiles (14.02.2013) Monitoring of the radiation induced effects of the CMS Tracker (21.09.2012) Measuring Doping Profiles with Spreading Resistance Profiling (06.10.2011) Production Process Analysis of CMS Sensors (21.07.2011) Poster OEPG 2011 on Material Analysis of Silicon Strip Sensors (16.06.2011) Scanning Electron Microscopy on double metal Sensors (20.05.2011) |