Hephy - CMS Inner Tracker Group Module Test Group Vienna
MD-Effect on Sensors

Common Mode Noise Problems

...were first found by our american colleagues. Certain modules show single strips with higly increased noise. This increase effects the whole APV and raises its noise level baseline significantly. The Common Mode Correction is not always able to compensate this effect. Therefor a campain to find and understand the cause of this localized single strip effect, was proclaimed.

Micro Discharge Effect

...is believed to be, at least one of the causes for CMN problems. Small localized peaks of the electrical field inside the sensor, may cause an avalanche effect. This would lead to an increase in strip current, which is usually seen on CMN problematic modules. The repeatedly occuring avalanches would add to the noise on the bad channel, causing the observed failure of the Common Mode Correction

Time Structure Measurements

...on the leakage current of sensors were thought to shed some light on the MD effect. A setup proposed by Mark Raymond (Imperial College, London) was adopted at the Hephy in Vienna. A document is available explaining the setup and how measurements were done.

MD Setup Description MD Measurement Results

2004, created by Marko Dragicevic